Measurement of electric-field intensities using scanning near-field microwave microscopy
نویسندگان
چکیده
منابع مشابه
Measurement of Electric-Field Intensities Using Scanning Near-Field Microwave Microscopy
In this paper, we propose methods for the measurement of electric intensities of a microwave field above the surface of microwave circuits. Using miniaturized coaxial antennas, we measure all spatial components of the induced field above device-under-test. A special position/signal difference method is used to better localize the measured field and increase the spatial resolution of the field m...
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متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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ژورنال
عنوان ژورنال: IEEE Transactions on Microwave Theory and Techniques
سال: 2003
ISSN: 0018-9480
DOI: 10.1109/tmtt.2003.818938